Alexis Comber, University of Leeds, UKAlfred Stein, ITC, University of Twente, the Netherlands
Ana-Maria Olteanu-Raimond, Cartography and Geomatics Laboratory, IGN, France
árpád Barsi, Budapest University of Technology and Economics, Hungary
Ashton Shortridge, Michigan State University, USA
Brian G Lees, The University of New South Wales, Australia
Cidalia Fonte, University of Coimbra, Portugal
Cyril de Runz, University of Reims Champagne-Ardenne, France
Deren Li, Wuhan University, China
Gerhard Navratil, Technical University of Vienna, Austria
Guoman Huang, Chinese Academy of Surveying and Mapping, China
Hussein M. Abdulmuttalib, Dubai Municipality, UAE
Jianya Gong, Wuhan University, China
Jingxiong Zhang, Wuhan University, China
Jixian Zhang, National Quality Inspection and Testing Center for Surveying and Mapping Products, China
Mahmoud R. Delavar, University of Tehran, Iran
Marco Minghini, GEOlab, Politecnico di Milano, Italy
Mir Abolfazl Mostafavi, Laval University, Canada
Nicholas Hamm, University of Twente, The Netherlands
Robert Weibel, University of Zurich, Switzerland
Rodolphe Devillers, Memorial University of Newfoundland, Canada
Wenzhong Shi, The Hong Kong Polytechnic University, China
Xiaohua Tong, Tongji University, China